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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Low cost fault detector guided by permanent faults at the end of FPGAs life cycle

โœ Scribed by Martins, Victor M. Goncalves; Ferlini, Frederico; Lettnin, Djones Vinicius; Bezerra, Eduardo Augusto


Book ID
126212346
Publisher
IEEE
Year
2014
Weight
223 KB
Category
Article
ISBN
1479947113

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