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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory

✍ Scribed by Pereira, Evaldo Carlos Fonseca; Goncalez, Odair Lelis; Vaz, Rafael Galhardo; Federico, Claudio Antonio; Both, Thiago Hanna; Wirth, Gilson Inacio

Book ID: 125490550
Publisher: IEEE
Year: 2014
Weight: 424 KB
Category: Article
ISBN: 1479947113
DOI: 10.1109/LATW.2014.6841919

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