✦ LIBER ✦

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Foundations for oxide breakdown compact modeling towards circuit-level simulations

✍ Scribed by Saliva, M.; Cacho, F.; Angot, D.; Huard, V.; Rafik, M.; Bravaix, A.; Anghel, L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2013 IEEE International Reliabilit

✍ Mense, A. T.; Gullo, L.; Thomas, J.; Shedlock, P. 📂 Article 📅 2013 🏛 IEEE ⚖ 382 KB

[IEEE 2013 IEEE International Reliabilit

✍ Katoozi, M.; Cannon, E. H.; Tuan Dao, ; Aitken, K.; Fischer, S.; Amort, T.; Bree 📂 Article 📅 2013 🏛 IEEE ⚖ 578 KB

[IEEE 2013 IEEE International Reliabilit

✍ Joshi, R.; Kanj, R.; Adams, C.; Warnock, J. 📂 Article 📅 2013 🏛 IEEE ⚖ 606 KB

[IEEE 2013 IEEE International Reliabilit

✍ Mahatme, N. N.; Gaspard, N. J.; Jagannathan, S.; Loveless, T. D.; Abdel-Aziz, H. 📂 Article 📅 2013 🏛 IEEE ⚖ 166 KB

[IEEE 2013 IEEE International Reliabilit

✍ Baozhen Li, ; Christiansen, C.; Burke, C.; Hogle, N.; Badami, D. 📂 Article 📅 2013 🏛 IEEE ⚖ 215 KB

[IEEE 2013 IEEE International Reliabilit

✍ Huard, V.; Cacho, F.; Federspiel, X. 📂 Article 📅 2013 🏛 IEEE ⚖ 512 KB