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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Short line electromigration characteristics and their applications for circuit design

✍ Scribed by Baozhen Li, ; Christiansen, C.; Burke, C.; Hogle, N.; Badami, D.

Book ID: 120583724
Publisher: IEEE
Year: 2013
Weight: 215 KB
Category: Article
ISBN: 1479901113
DOI: 10.1109/IRPS.2013.6532000

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