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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Scalable dynamic technique for accurately predicting power-supply noise and path delay

✍ Scribed by Rao, S. K.; Robucci, R.; Patel, C.

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