[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Gate dielectric TDDB characterizations of advanced High-k and metal-gate CMOS logic transistor technology

[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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[IEEE 2012 IEEE International Reliabilit

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