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[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs

✍ Scribed by Canderle, E.; Chevalier, P.; Montagne, A.; Moynet, L.; Avenier, G.; Boulenc, P.; Buczko, M.; Carminati, Y.; Rosa, J.; Gaquiere, C.; Chantre, A.

Book ID: 118265979
Publisher: IEEE
Year: 2012
Weight: 613 KB
Category: Article
ISBN: 1467330191
DOI: 10.1109/bctm.2012.6352650

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