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[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - HBT device robustness against process variations in millimeter-wave BiCMOS technology

✍ Scribed by Avenier, G.; Chevalier, P.; Montagne, A.; Parmigiani, L.; Berthier, L.; Renault, O.; Oghdayan, E.; Mathieu, M.; Campidelli, Y.; Dutartre, D.; Chantre, A.

Book ID: 118258234
Publisher: IEEE
Year: 2012
Weight: 313 KB
Category: Article
ISBN: 1467330191
DOI: 10.1109/bctm.2012.6352652

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