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[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - The link between NBTI and TDDB of high-k gate P-MOSFETs

โœ Scribed by Gao, Y.; Ang, D. S.


Book ID
120559694
Publisher
IEEE
Year
2012
Weight
223 KB
Category
Article
ISBN
1467309826

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