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[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - 1/f Noise measurement and its doping dependencies of Si Hall sensors

✍ Scribed by Sun, Kai; Wang, Mingxiang

Book ID: 118219041
Publisher: IEEE
Year: 2012
Weight: 324 KB
Category: Article
ISBN: 1467309826
DOI: 10.1109/ipfa.2012.6306263

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