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[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Interface trap distribution for HCI reliability assessment on bend gate structure by 3D TCAD simulation

✍ Scribed by Prabowo, Briliant Adhi; Amethystna, Surya Kris; Tsai, Jung-Ruey; Yang, Shao-Ming; Sheu, Gene

Book ID: 120158057
Publisher: IEEE
Year: 2012
Weight: 540 KB
Category: Article
ISBN: 1467309826
DOI: 10.1109/IPFA.2012.6306270

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