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[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - New Tellurium implant and segregation for contact resistance reduction and single metallic silicide technology for independent contact resistance optimization in n- and p-FinFETs

โœ Scribed by Koh, Shao-Ming; Kong, Eugene Yu Jin; Liu, Bin; Ng, Chee-Mang; Liu, Pan; Mo, Zhi-Qiang; Leong, Kam-Chew; Samudra, Ganesh S.; Yeo, Yee-Chia


Book ID
126635589
Publisher
IEEE
Year
2011
Weight
355 KB
Category
Article
ISBN
1424484936

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