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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Multi-core software/hardware co-debug platform with ARM CoreSight™, on-chip test architecture and AXI/AHB bus monitor

✍ Scribed by Su, Jiff Kuo Alan P.; Lee, Kuen-Jong; Huang, Ing-Jer; Jian, Guo-An; Chien, Cheng-An; Guo, Jiun-In; Chen, Chien-Hung

Book ID: 121737780
Publisher: IEEE
Year: 2011
Weight: 437 KB
Category: Article
ISBN: 1424485002
DOI: 10.1109/VDAT.2011.5783594

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