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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2011) - Hsinchu (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Monitoring gate and interconnect delay variations by using ring oscillators

✍ Scribed by Ying-Yen Chen, ; Chen-Tung Lin, ; Jin-Nung Lee, ; Chi-Feng Wu,

Book ID: 126709514
Publisher: IEEE
Year: 2011
Weight: 538 KB
Category: Article
ISBN: 1424485002
DOI: 10.1109/VDAT.2011.5783597

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