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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Measurement error analysis and calibration techniques for built-in jitter measurement circuit

✍ Scribed by Cheng, Kuo-Hsing; Chang, Chih-Yu; Liu, Jen-Chieh; Cheng, Chih-Ping

Book ID: 121879906
Publisher: IEEE
Year: 2011
Weight: 304 KB
Category: Article
ISBN: 1424485002
DOI: 10.1109/VDAT.2011.5783600

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