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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - An all-digital on-chip jitter measurement circuit in 65nm CMOS technology

✍ Scribed by Chung, Ching-Che; Chu, Wei-Jung

Book ID: 120559125
Publisher: IEEE
Year: 2011
Weight: 219 KB
Category: Article
ISBN: 1424485002
DOI: 10.1109/VDAT.2011.5783605

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