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[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Effective algorithm for integrating clock gating and power gating to reduce dynamic and active leakage power simultaneously

✍ Scribed by Li, Li; Choi, Ken; Nan, Haiqing

Book ID: 118212937
Publisher: IEEE
Year: 2011
Weight: 348 KB
Volume: 0
Category: Article
ISBN: 161284913X
DOI: 10.1109/isqed.2011.5770706

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