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[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Design of ultra-low-leakage logic gates and flip-flops in high-performance FinFET technology

✍ Scribed by Bhoj, Ajay N.; Jha, Niraj K.

Book ID: 115492878
Publisher: IEEE
Year: 2011
Weight: 320 KB
Volume: 0
Category: Article
ISBN: 161284913X
DOI: 10.1109/isqed.2011.5770805

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