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[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Low power latch design in near sub-threshold region to improve reliability for soft error

✍ Scribed by Sriram, Sandeep; Nan, Haiqing; Choi, Ken

Book ID: 115492877
Publisher: IEEE
Year: 2011
Weight: 528 KB
Volume: 0
Category: Article
ISBN: 161284913X
DOI: 10.1109/isqed.2011.5770791

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