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[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - An accurate and scalable MOSFET aging model for circuit simulation

✍ Scribed by Tudor, Bogdan; Wang, Joddy; Chen, Zhaoping; Tan, Robin; Liu, Weidong; Lee, Frank

Book ID: 115472401
Publisher: IEEE
Year: 2011
Weight: 448 KB
Volume: 0
Category: Article
ISBN: 161284913X
DOI: 10.1109/isqed.2011.5770765

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