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[IEEE 2011 International Symposium on Advanced Packaging Materials (APM) - Xiamen, China (2011.10.25-2011.10.28)] 2011 International Symposium on Advanced Packaging Materials (APM) - Studies of the degradation mechanisms in high power diode lasers

✍ Scribed by Guoguang, Lu; Yun, Huang; Zhifeng, Lei

Book ID: 125488057
Publisher: IEEE
Year: 2011
Weight: 775 KB
Category: Article
ISBN: 1467301485
DOI: 10.1109/ISAPM.2011.6105676

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