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[IEEE 2011 International Symposium on Advanced Packaging Materials (APM) - Xiamen, China (2011.10.25-2011.10.28)] 2011 International Symposium on Advanced Packaging Materials (APM) - Static thermal resistance test and simulation analysis technology for hybrid microcircuit

✍ Scribed by Zhou, Bin; Qi, Xueli

Book ID: 120195239
Publisher: IEEE
Year: 2011
Weight: 183 KB
Category: Article
ISBN: 1467301485
DOI: 10.1109/ISAPM.2011.6105738

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