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[IEEE 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Osaka, Japan (2011.09.8-2011.09.10)] 2011 International Conference on Simulation of Semiconductor Processes and Devices - A compact model for early electromigration lifetime estimation

✍ Scribed by de Orio, R. L.; Ceric, H.; Selberherr, S.

Book ID: 121235665
Publisher: IEEE
Year: 2011
Weight: 270 KB
Category: Article
ISBN: 1612844197
DOI: 10.1109/SISPAD.2011.6035040

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