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[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Characterization and modelling of gate current injection in embedded non-volatile flash memory

✍ Scribed by Zaka, Alban; Garetto, Davide; Rideau, Denis; Palestri, Pierpaolo; Manceau, Jean-Philippe; Dornel, Erwan; Rafhay, Quentin; Clerc, Raphael; Leblebici, Yusuf; Tavernier, Clement; Jaouen, Herve

Book ID: 118008199
Publisher: IEEE
Year: 2011
Weight: 759 KB
Volume: 0
Category: Article
ISBN: 1424485266
DOI: 10.1109/icmts.2011.5976874

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