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[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS 2011) - Amsterdam (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Gated diode in breakdown voltage collapse regime — A test vehicle for oxide characterization

✍ Scribed by Rusu, A.; Badila, M.; Rusu, A.

Book ID: 118008200
Publisher: IEEE
Year: 2011
Weight: 662 KB
Volume: 0
Category: Article
ISBN: 1424485282
DOI: 10.1109/icmts.2011.5976875

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