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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors

✍ Scribed by Martins, C. V.; Semiao, J.; Vazquez, J. C.; Champac, V.; Santos, M.; Teixeira, I. C.; Teixeira, J. P.

No coin nor oath required. For personal study only.

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