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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Memory-based embedded digital ATE

✍ Scribed by Lee, Dongsoo; Park, Sang Phill; Goel, Ashish; Roy, Kaushik

No coin nor oath required. For personal study only.

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