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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Power-aware test generation with guaranteed launch safety for at-speed scan testing

✍ Scribed by Wen, X.; Enokimoto, K.; Miyase, K.; Yamato, Y.; Kochte, M. A.; Kajihara, S.; Girard, P.; Tehranipoor, M.

No coin nor oath required. For personal study only.

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