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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Leakage power profiling and leakage power reduction using DFT hardware

✍ Scribed by Sethuram, Rajamani; Arabi, Karim; Abu-Rahma, Mohamed

No coin nor oath required. For personal study only.

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