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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Exponent monitoring for low-cost concurrent error detection in FPU control logic

✍ Scribed by Maniatakos, Michail; Makris, Yiorgos; Kudva, Prabhakar; Fleischer, Bruce

No coin nor oath required. For personal study only.

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