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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - A unified test architecture for on-line and off-line delay fault detections

✍ Scribed by Pei, Songwei; Li, Huawei; Li, Xiaowei

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