𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

✍ Scribed by Hafer, Craig; Lahey, Mike; Harris, Debra; Larsen, Jennifer; Sievert, Fred; Sims, Tony; Meyer, Steve; Dumitru, Radu; Jordan, Anthony; Milliken, Peter

Book ID: 120820617
Publisher: IEEE
Year: 2011
Weight: 298 KB
Category: Article
ISBN: 1457712814
DOI: 10.1109/REDW.2010.6062506

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Radiation Characterization of Commercial GaN Devices

✍ Harris, Richard D.; Scheick, Leif Z.; Hoffman, James P.; Thrivikraman, Tushar; J 📂 Article 📅 2011 🏛 IEEE ⚖ 668 KB

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Guide to the 2010 IEEE Radiation Effects Data Workshop Record

✍ Hiemstra, David M. 📂 Article 📅 2011 🏛 IEEE ⚖ 197 KB

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Single Event Sensitivity of High-Speed Differential Signaling Devices to Heavy Ions and Protons

✍ Koga, R.; George, J.; Bielat, S.; Yu, P. 📂 Article 📅 2011 🏛 IEEE ⚖ 548 KB

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Neutron Beam Testing of High Performance Computing Hardware

✍ Michalak, Sarah E.; DuBois, Andrew J.; Storlie, Curtis B.; Quinn, Heather M.; Ru 📂 Article 📅 2011 🏛 IEEE ⚖ 245 KB

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - A Summary of Single Event Upset Testing of CD4000 Series Devices

✍ Lombardi, Robert E.; Bogorad, Alexander L.; Likar, Justin J.; Rubin, Aaron S.; C 📂 Article 📅 2011 🏛 IEEE ⚖ 206 KB

[IEEE 2011 IEEE Radiation Effects Data W

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Total Dose Test Results for CubeSat Electronics

✍ Avery, Keith; Finchel, Jeffery; Mee, Jesse; Kemp, William; Netzer, Richard; Elki 📂 Article 📅 2011 🏛 IEEE ⚖ 736 KB