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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Overcoming carbon nanotube variations through co-optimized technology and circuit design

✍ Scribed by Zhang, Jie; Patil, Nishant; Philip Wong, H.-S.; Mitra, Subhasish

No coin nor oath required. For personal study only.

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