✦ LIBER ✦

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Transistor matching and silicon thickness variation in ETSOI technology

✍ Scribed by Hook, Terence B.; Vinet, Maud; Murphy, Richard; Ponoth, Shom; Grenouillet, Laurent

No coin nor oath required. For personal study only.

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