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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - PRAM cell technology and characterization in 20nm node size

✍ Scribed by Kang, M. J.; Park, T. J.; Kwon, Y. W.; Ahn, D. H.; Kang, Y. S.; Jeong, H.; Ahn, S. J.; Song, Y. J.; Kim, B. C.; Nam, S.W.; Kang, H. K.; Jeong, G. T.; Chung, C. H.

Book ID: 120056094
Publisher: IEEE
Year: 2011
Weight: 459 KB
Category: Article
ISBN: 1457705044
DOI: 10.1109/IEDM.2011.6131478

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