✦ LIBER ✦

[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Large-scale statistical simulation of characteristic variation in 16-nm-gate Bulk FinFET devices due to work function fluctuation

✍ Scribed by Yiu, Chun-Yen; Cheng, Hui-Wen; Su, Hsin-Wen; Li, Yiming

No coin nor oath required. For personal study only.

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