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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - On Detecting Transition Faults in the Presence of Clock Delay Faults

✍ Scribed by Higami, Yoshinobu; Takahashi, Hiroshi; Kobayashi, Shin-ya; Saluja, Kewal K.

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