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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip

✍ Scribed by Karimi, Naghmeh; Kong, Zhiqiu; Chakrabarty, Krishnendu; Gupta, Pallav; Patil, Srinivas

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