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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Mapping Transaction Level Faults to Stuck-At Faults in Communication Hardware

✍ Scribed by Javaheri, Fatemeh; Namaki-Shoushtari, Majid; Kamranfar, Parastoo; Navabi, Zainalabedin

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