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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects

✍ Scribed by Chen, Po-Juei; Hsu, Wei-Li; Li, James C.-M.; Tseng, Nan-Hsin; Chen, Kuo-Yin; Changchien, Wei-pin; Liu, Charles C.C.

Book ID: 125464988
Publisher: IEEE
Year: 2011
Weight: 241 KB
Category: Article
ISBN: 0769545831
DOI: 10.1109/ats.2011.23

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