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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Post-Silicon Timing Validation Method Using Path Delay Measurements

✍ Scribed by Jang, Eun Jung; Chung, Jaeyong; Gattiker, Anne; Nassif, Sani; Abraham, Jacob A.

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