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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - On Defect Oriented Testing for Hybrid CMOS/Memristor Memory

✍ Scribed by Haron, Nor Zaidi; Hamdioui, Said; Haron, Nor Zaidi

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