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[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects

✍ Scribed by Li, Tsung-Yeh; Huang, Shi-Yu; Hsu, Hsuan-Jung; Tzeng, Chao-Wen; Huang, Chih-Tsun; Liou, Jing-Jia; Ma, Hsi-Pin; Huang, Po-Chiun; Bor, Jenn-Chyou; Wu, Cheng-Wen; Tien, Ching-Cheng; Wang, Mike

Book ID: 120354886
Publisher: IEEE
Year: 2010
Weight: 556 KB
Category: Article
ISBN: 1424484472
DOI: 10.1109/DFT.2010.48

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