𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Online Multiple Fault Detection in Reversible Circuits

✍ Scribed by Farazmand, Navid; Zamani, Masoud; Tahoori, Mehdi B.

Book ID: 120071227
Publisher: IEEE
Year: 2010
Weight: 308 KB
Category: Article
ISBN: 1424484472
DOI: 10.1109/DFT.2010.57

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 IEEE International Symposium

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Soft Error Tolerant BILBO FF

✍ Namba, Kazuteru; Ito, Hideo 📂 Article 📅 2010 🏛 IEEE ⚖ 160 KB

[IEEE 2010 IEEE International Symposium

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Low-Power Testing for Low-Power Devices

✍ Wen, Xiaoqing 📂 Article 📅 2010 🏛 IEEE ⚖ 241 KB

[IEEE 2010 IEEE International Symposium

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Modelling a CNTFET with Undeposited CNT Defects

✍ Cho, Geunho; Lombardi, Fabrizio; Kim, Yong-Bin 📂 Article 📅 2010 🏛 IEEE ⚖ 373 KB

[IEEE 2010 IEEE International Symposium

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Single Event Induced Double Node Upset Tolerant Latch

✍ Namba, Kazuteru; Sakata, Masatoshi; Ito, Hideo 📂 Article 📅 2010 🏛 IEEE ⚖ 158 KB

[IEEE 2010 IEEE International Symposium

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Massively Deployable Intelligent Sensors for the Smart Power Grid

✍ Jain, Vijay K.; Chapman, Glenn H. 📂 Article 📅 2010 🏛 IEEE ⚖ 600 KB

[IEEE 2010 IEEE International Symposium

[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - A Reliable Reconfiguration Controller for Fault-Tolerant Embedded Systems on Multi-FPGA Platforms

✍ Bolchini, C.; Fossati, L.; Codinachs, D. Merodio; Miele, A.; Sandionigi, C. 📂 Article 📅 2010 🏛 IEEE ⚖ 274 KB