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[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Single Event Induced Double Node Upset Tolerant Latch

✍ Scribed by Namba, Kazuteru; Sakata, Masatoshi; Ito, Hideo

Book ID: 118069820
Publisher: IEEE
Year: 2010
Weight: 158 KB
Volume: 0
Category: Article
ISBN: 1424484472
DOI: 10.1109/dft.2010.41

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