𝔖 Bobbio Scriptorium

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[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Reliability and Performance Analysis of FPGA-Based Fault Tolerant System

✍ Scribed by Noji, Ryoji; Fujie, Satoshi; Yoshikawa, Yuki; Ichihara, Hideyuki; Inoue, Tomoo

Book ID: 118119339
Publisher: IEEE
Year: 2009
Weight: 683 KB
Volume: 0
Category: Article
ISBN: 0769538398
DOI: 10.1109/dft.2009.27

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