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[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - A critical examination of 3D stackable NAND Flash memory architectures by simulation study of the scaling capability

✍ Scribed by Hsiao, Yi-Hsuan; Lue, Hang-Ting; Hsu, Tzu-Hsuan; Hsieh, Kuang-Yeu; Lu, Chih-Yuan

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