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[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - On the ‘permanent’ component of NBTI

✍ Scribed by Grasser, T.; Aichinger, Th.; Reisinger, H.; Franco, J.; Wagner, P.-J.; Nelhiebel, M.; Ortolland, C.; Kaczer, B.

Book ID: 126696974
Publisher: IEEE
Year: 2010
Weight: 510 KB
Category: Article
ISBN: 1424485215
DOI: 10.1109/IIRW.2010.5706472

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