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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Evaluating transient-fault effects on traditional C-element's implementations

✍ Scribed by Bastos, Rodrigo Possamai; Sicard, Gilles; Kastensmidt, Fernanda; Renaudin, Marc; Reis, Ricardo

No coin nor oath required. For personal study only.

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