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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - How to flip a bit?

✍ Scribed by Agoyan, Michel; Dutertre, Jean-Max; Mirbaha, Amir-Pasha; Naccache, David; Ribotta, Anne-Lise; Tria, Assia

Book ID: 126618786
Publisher: IEEE
Year: 2010
Weight: 461 KB
Category: Article
ISBN: 1424477247
DOI: 10.1109/IOLTS.2010.5560194

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